fault diagnosis in sequential circuits pdf

For combinational logic circuits one powerful approach. There are no faults in the LSC if and only if these vectors agree. In this chapter most of the major techniques of fault detection are described. The test is defined here as a procedure consisting of: (a) Application of the unit input vector (or zero input vector) followed by 2n zero input vectors, (b) Comparison of the resulting output vectors with the vectors AnBdv. proposed technique can be employed for the detection of faults in a sequential circuit with high fault coverage. (s is the number of primary input terminals, n is the dimension of LSC, A is its characteristic matrix and Sv is the unit input vector having 1 on the position v.) It is shown that the set of s+1 tests is sufficient to detect the existence of any fault that belongs to the set of defined faults. The characterizing matrix B, s vectors of the form AnBdv (v=l,2.,s), s unit input vectors and the zero input vector are used instead of the fault table. The following is assumed: 1) The faults are those which cause the LSC to behave as if some of its primary (external) or secondary (internal) terminals were permanently stuck at zero, or permanently stuck at one 2) That all testing must be performed on the external terminals of the LSC. A procedure for detection of faults in a simple controllable Linear Sequential Circuit (LSC) over GF(2) is developed. This thesis is concerned with the detection of non-transient faults in digital networks.

Fault diagnosis in sequential circuits pdf